Invention Grant
- Patent Title: Application error analysis from screenshot
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Application No.: US16795432Application Date: 2020-02-19
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Publication No.: US11436713B2Publication Date: 2022-09-06
- Inventor: Benjamin P. Segal , James William Murdock, IV , Radha Mohan De , Sujoy Roy , John Martin Prager
- Applicant: International Business Machines Corporation
- Applicant Address: US NY Armonk
- Assignee: International Business Machines Corporation
- Current Assignee: International Business Machines Corporation
- Current Assignee Address: US NY Armonk
- Agency: Sherman IP LLP
- Agent Kenneth L. Sherman; Steven Laut
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/11 ; G06T3/40 ; G06N5/02 ; G06N20/00 ; G06V20/62 ; G06V30/10

Abstract:
A method for determining an application error from a screenshot includes receiving, by a computing device, a computer application screenshot image indicating a computer error has occurred. The computing device analyzes the computer application screenshot image using a machine learning image analysis to determine one or more error regions in the computer application screenshot image. The computing device further processes the analyzed computer application screenshot to extract text from the one or more error regions in the computer application screenshot image. The computing device determines the application error based upon the extracted text. The computing device further automatically applies an automated error fix based upon the determined application error.
Public/Granted literature
- US20210256681A1 APPLICATION ERROR ANALYSIS FROM SCREENSHOT Public/Granted day:2021-08-19
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