Invention Grant
- Patent Title: Semiconductor device and operation method of the semiconductor device
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Application No.: US17148075Application Date: 2021-01-13
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Publication No.: US11408930B2Publication Date: 2022-08-09
- Inventor: Young Jin Moon
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: William Park & Associates Ltd.
- Priority: KR10-2020-0080790 20200701
- Main IPC: G01R31/28
- IPC: G01R31/28
Abstract:
A semiconductor device includes a voltage comparison circuit and a calibration control circuit. The voltage comparison circuit compares test reference voltages and generates a comparison result signal. The calibration control circuit controls an offset value of the voltage comparison circuit.
Public/Granted literature
- US20220003813A1 SEMICONDUCTOR DEVICE AND OPERATION METHOD OF THE SEMICONDUCTOR DEVICE Public/Granted day:2022-01-06
Information query
