Invention Grant
- Patent Title: Charged particle beam system
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Application No.: US17279041Application Date: 2018-10-10
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Publication No.: US11380514B2Publication Date: 2022-07-05
- Inventor: Hirokazu Tamaki
- Applicant: Hitachi High-Tech Corporation
- Applicant Address: JP Tokyo
- Assignee: Hitachi High-Tech Corporation
- Current Assignee: Hitachi High-Tech Corporation
- Current Assignee Address: JP Tokyo
- Agency: Crowell & Moring LLP
- International Application: PCT/JP2018/037738 WO 20181010
- International Announcement: WO2020/075241 WO 20200416
- Main IPC: H01J37/21
- IPC: H01J37/21 ; H01J37/22 ; H01J37/28

Abstract:
A control system of a charged particle beam apparatus obtains a first coefficient by performing multiple resolution analysis based on wavelet transform or discrete wavelet transform on at least a part of an image or a signal acquired by the charged particle beam apparatus. The control system obtains a second coefficient by performing, on at least a part of the first coefficient or an absolute value of the first coefficient, any one of calculation of a maximum value, calculation of a numerical value corresponding to a specified order in an order related to a magnitude, fitting to a histogram, calculation of an average value, and calculation of a total sum.
Public/Granted literature
- US20220005667A1 Charged Particle Beam System Public/Granted day:2022-01-06
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