Invention Grant
- Patent Title: Selective relocation of data of a subset of a data block based on distribution of reliability statistics
-
Application No.: US17178976Application Date: 2021-02-18
-
Publication No.: US11379122B2Publication Date: 2022-07-05
- Inventor: Ashutosh Malshe , Kishore Kumar Muchherla , Vamsi Pavan Rayaprolu , Harish R. Singidi
- Applicant: Micron Technology, Inc.
- Applicant Address: US ID Boise
- Assignee: Micron Technology, Inc.
- Current Assignee: Micron Technology, Inc.
- Current Assignee Address: US ID Boise
- Agency: Lowenstein Sandler LLP
- Main IPC: G06F3/00
- IPC: G06F3/00 ; G06F3/06 ; G06F16/23

Abstract:
A set of memory cells in a data block of a memory component is sampled. A distribution statistic is generated for the data block based on a reliability statistic for each of the set of sampled memory cells. A determination is made based on the distribution statistic of whether the read disturb stress is uniformly or non-uniformly distributed across the data block. In response to a determination that the read disturb stress is non-uniformly distributed across the data block, a first subset of the data block is relocated to another data block of the memory component. The first subset of the data block is associated with a higher concentration of read disturb stress than other subsets of the data block.
Public/Granted literature
- US20210173569A1 SELECTIVE RELOCATION OF DATA OF A SUBSET OF A DATA BLOCK BASED ON DISTRIBUTION OF RELIABILITY STATISTICS Public/Granted day:2021-06-10
Information query