A production method for producing a circuit optimized to be protected against radiation includes a preliminary characterization stage performed on a reference circuit. The preliminary characterization stage includes the steps of: irradiating the reference circuit a plurality of times; after each irradiation, if one or more reference elements of the reference circuit have failed, locating said reference element(s); and mapping the impact of the irradiations on the reference surface of the reference circuit. The production method further includes an optimization stage comprising the step of adapting the position of at least one optimized radiation-sensitive element on at least one optimized surface of the optimized circuit as a function of the mapping performed on the reference circuit.