- Patent Title: Apparatus for measuring surface profile of normal and shear stress
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Application No.: US16650021Application Date: 2018-09-25
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Publication No.: US11378477B2Publication Date: 2022-07-05
- Inventor: Mykhailo Pevnyi , Tianyi Guo , Fred Minkowski , Vincent Hetherington , Hiroshi Yokoyama , Peter Palffy-Muhoray
- Applicant: Kent State University
- Applicant Address: US OH Kent
- Assignee: Kent State University
- Current Assignee: Kent State University
- Current Assignee Address: US OH Kent
- Agency: Fay Sharpe LLP
- International Application: PCT/US2018/052544 WO 20180925
- International Announcement: WO2019/060870 WO 20190328
- Main IPC: G01L5/00
- IPC: G01L5/00 ; G01L5/1623 ; A43B17/04 ; G01L1/20 ; G01N3/24 ; A43B3/34
Abstract:
An apparatus for measuring normal and shear stress at a surface. The apparatus includes a substrate; and a plurality of sensing units on the substrate. Each sensing unit includes a mechanical transducer having a receiving surface and a sensing surface; and a plurality of normal force sensors between the sensing surface and the substrate.
Public/Granted literature
- US20200278283A1 APPARATUS FOR MEASURING SURFACE PROFILE OF NORMAL AND SHEAR STRESS Public/Granted day:2020-09-03
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