Invention Grant
- Patent Title: Generating digital models of crop yield based on crop planting dates and relative maturity values
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Application No.: US16916022Application Date: 2020-06-29
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Publication No.: US11375674B2Publication Date: 2022-07-05
- Inventor: Ying Xu , Erik Andrejko
- Applicant: CLIMATE LLC
- Applicant Address: US CA San Francisco
- Assignee: CLIMATE LLC
- Current Assignee: CLIMATE LLC
- Current Assignee Address: US CA San Francisco
- Agency: Harness, Dickey & Pierce, P.L.C.
- Main IPC: A01G22/00
- IPC: A01G22/00 ; G06Q50/02 ; A01G7/00 ; G06Q10/04 ; H04L43/045 ; H04L67/10 ; H04L67/12

Abstract:
A method for generating digital models of potential crop yield based on planting date, relative maturity, and actual production history is provided. In an embodiment, data representing historical planting dates, relative maturity values, and crop yield is received by an agricultural intelligence computer system. Based on the historical data, the system generates spatial and temporal maps of planting dates, relative maturity, and actual production history. Using the maps, the system creates a model of potential yield that is dependent on planting date and relative maturity. The system may then receive actual production history data for a particular field. Using the received actual production history data, a particular planting date, and a particular relative maturity value, the agricultural intelligence computer system computes a potential yield for a particular field.
Public/Granted literature
- US20200329650A1 GENERATING DIGITAL MODELS OF CROP YIELD BASED ON CROP PLANTING DATES AND RELATIVE MATURITY VALUES Public/Granted day:2020-10-22
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