Systems, methods, and apparatus related to memory devices such as solid state drives. In one approach, data is received from a host system (e.g., data to be written to an SSD). The received data is encoded using a first error correction code to generate first parity data. A temperature at which memory cells of a storage device (e.g., the SSD) will store the received data is determined. In response to determining the temperature, a first portion of the received data is identified (e.g., data in memory storage that is error-prone at a predicted higher temperature that has been determined based on output from an artificial neural network using sensor(s) input). The identified first portion is encoded using a second error correction code to generate second parity data. The second error correction code has a higher error correction capability than the first error correction code. The encoded first portion, the first parity data, and the second parity data are stored in the memory cells of the storage device.