Invention Grant
- Patent Title: Measurement circuit
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Application No.: US16127703Application Date: 2018-09-11
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Publication No.: US11293959B2Publication Date: 2022-04-05
- Inventor: Erin C. McPhalen
- Applicant: Schneider Electric USA, Inc.
- Applicant Address: US MA Andover
- Assignee: Schneider Electric USA, Inc.
- Current Assignee: Schneider Electric USA, Inc.
- Current Assignee Address: US MA Andover
- Agency: Locke Lord LLP
- Main IPC: G01R21/14
- IPC: G01R21/14 ; G01R21/133

Abstract:
A measurement circuit for monitoring at least one parameter of an input signal received from an external signal source includes at least one first measurement element coupled to the input signal and configured to provide an initial measurement signal indicative of a respective one or more of the at least one parameter of the input signal. At least one second measurement element is positioned proximate to the at least one first measurement element and configured to have a characteristic indicative of a stress condition associated with the at least one first measurement element. A compensation circuit is responsive to an output of the at least one second measurement element and to a reference signal to generate a compensation factor that is applied to the initial measurement signal to provide a corrected measurement signal.
Public/Granted literature
- US20190257865A1 MEASUREMENT CIRCUIT Public/Granted day:2019-08-22
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