Invention Grant
- Patent Title: Inspection system, inspection method, and inspection program
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Application No.: US17482516Application Date: 2021-09-23
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Publication No.: US11277530B2Publication Date: 2022-03-15
- Inventor: Takao Kurohata
- Applicant: KONICA MINOLTA, INC.
- Applicant Address: JP Tokyo
- Assignee: KONICA MINOLTA, INC.
- Current Assignee: KONICA MINOLTA, INC.
- Current Assignee Address: JP Tokyo
- Agency: Buchanan Ingersoll & Rooney PC
- Priority: JPJP2019-073365 20190408
- Main IPC: H04N1/00
- IPC: H04N1/00

Abstract:
An inspection system includes: an inspection part that compares a scanned image obtained by scanning a sheet on which an image is formed on the basis of a job with a reference image prepared in advance and thereby performs inspection of the scanned image; and a hardware processor that sets an inspection target page to be a target of inspection and a non-inspection target page to be excluded from inspection, for the job, wherein the hardware processor causes the inspection part to perform inspection for the inspection target page and not to perform inspection for the non-inspection target page on the basis of the setting of the hardware processor, and the hardware processor creates an inspection report including scanned images of all pages of the job including the non-inspection target page.
Public/Granted literature
- US20220014637A1 INSPECTION SYSTEM, INSPECTION METHOD, AND INSPECTION PROGRAM Public/Granted day:2022-01-13
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