Invention Grant
- Patent Title: Secondary battery inspection apparatus and method
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Application No.: US16700183Application Date: 2019-12-02
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Publication No.: US11276888B2Publication Date: 2022-03-15
- Inventor: Kwangyong You , Sunggeun Ji
- Applicant: Kwangyong You , Sunggeun Ji
- Applicant Address: KR Namyangju-si; KR Hwaseong-si
- Assignee: Kwangyong You,Sunggeun Ji
- Current Assignee: Kwangyong You,Sunggeun Ji
- Current Assignee Address: KR Namyangju-si; KR Hwaseong-si
- Agency: NSIP Law
- Priority: KR10-2019-0052496 20190503
- Main IPC: H01M10/42
- IPC: H01M10/42 ; G01N23/04

Abstract:
A secondary battery inspection apparatus includes a support unit configured to support a secondary battery set including at least one secondary battery, an X-ray source configured to radiate an X-ray beam to the secondary battery set, and an X-ray detector configured to detect the X-ray beam generated from the X-ray source and passing through the secondary battery set, wherein the secondary battery set is divided into an interest area and a non-interest area, the support unit rotates the secondary battery set in place, and at least one selected from a division angle between a plurality of X-ray radiation points and an X-ray radiation time is differentiated depending on whether the X-ray source photographs the interest area or whether the X-ray source photographs the non-interest area.
Public/Granted literature
- US20200350637A1 SECONDARY BATTERY INSPECTION APPARATUS AND METHOD Public/Granted day:2020-11-05
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