Invention Grant
- Patent Title: Semiconductor device and method of manufacturing the same
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Application No.: US16310713Application Date: 2016-06-27
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Publication No.: US11276769B2Publication Date: 2022-03-15
- Inventor: Huilong Zhu
- Applicant: INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
- Applicant Address: CN Beijing
- Assignee: INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
- Current Assignee: INSTITUTE OF MICROELECTRONICS, CHINESE ACADEMY OF SCIENCES
- Current Assignee Address: CN Beijing
- Agency: Christensen, Fonder, Dardi & Herbert PLLC
- Priority: CN201610438781.1 20160617
- International Application: PCT/CN2016/087284 WO 20160627
- International Announcement: WO2017/215025 WO 20171221
- Main IPC: H01L27/11521
- IPC: H01L27/11521 ; H01L29/66 ; H01L27/088 ; H01L29/04 ; H01L29/78 ; H01L21/02 ; H01L27/06

Abstract:
A method of manufacturing a semiconductor device may include: forming a fin-shaped structure on a substrate; forming a supporting layer on the substrate having the fin-shaped structure formed thereon, and patterning the supporting layer into a supporting portion extending from a surface of the substrate to a surface of the fin-shaped structure and thus physically connecting them; removing a portion of the fin-shaped structure close to the substrate to form a first semiconductor layer spaced apart from the substrate; growing a second semiconductor layer with the first semiconductor layer as a seed layer; and in at least a fraction of the longitudinal extent, removing the first semiconductor layer, and cutting off the second semiconductor layer on sides of the first semiconductor layer away from the substrate and close to the substrate, respectively, so that the cut-off second semiconductor layer acts as a fin of the device.
Public/Granted literature
- US20190267466A1 SEMICONDUCTOR DEVICE AND METHOD OF MANUFACTURING THE SAME Public/Granted day:2019-08-29
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