Invention Grant
- Patent Title: Charged particle optical apparatus for through-the-lens detection of particles
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Application No.: US17078334Application Date: 2020-10-23
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Publication No.: US11276547B2Publication Date: 2022-03-15
- Inventor: Erik Essers , Michael Albiez , Stefan Meyer , Daniel Kirsten , Stewart Bean
- Applicant: Carl Zeiss Microscopy GmbH
- Applicant Address: DE Jena
- Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee: Carl Zeiss Microscopy GmbH
- Current Assignee Address: DE Jena
- Agency: Alston & Bird LLP
- Main IPC: H01J37/18
- IPC: H01J37/18 ; H01J37/147 ; H01J37/22 ; H01J37/244 ; H01J37/145 ; H01J37/28

Abstract:
Disclosed is a charged particle optical apparatus. The charged particle optical apparatus has a liner electrode in a first vacuum zone. The liner electrode is used to generate an electrostatic objective lens field. The apparatus has a second electrode which surrounds at least a section of the primary particle beam path. The section extends in the first vacuum zone and downstream of the liner electrode. A third electrode is provided having a differential pressure aperture through which the particle beam path exits from the first vacuum zone. A particle detector is configured for detecting emitted particles, which are emitted from the object and which pass through the differential pressure aperture of the third electrode. The liner electrode, the second and third electrodes are operable at different potentials relative to each other.
Public/Granted literature
- US20210050178A1 CHARGED PARTICLE OPTICAL APPARATUS FOR THROUGH-THE-LENS DETECTION OF PARTICLES Public/Granted day:2021-02-18
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