Memory readout circuit and method
Abstract:
A circuit includes an OTP cell, an NVM cell, and a bit line coupled to the OTP cell, the NVM cell, and a first input terminal of an amplifier. The amplifier is configured to generate an output voltage based on a signal on the bit line, an ADC is configured to generate a digital output signal based on the output voltage, and a comparator includes a first input port coupled to an output port of the ADC and is configured to output a data bit responsive to a comparison of the digital output signal to a threshold level received at a second input port.
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