Invention Grant
- Patent Title: Failure diagnosis system
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Application No.: US16617084Application Date: 2018-02-22
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Publication No.: US11269322B2Publication Date: 2022-03-08
- Inventor: Munetoshi Unuma , Kohji Maki , Tetsuji Kato
- Applicant: Hitachi, Ltd.
- Applicant Address: JP Tokyo
- Assignee: Hitachi, Ltd.
- Current Assignee: Hitachi, Ltd.
- Current Assignee Address: JP Tokyo
- Agency: Mattingly & Malur, PC
- Priority: JPJP2017-165276 20170830
- International Application: PCT/JP2018/006545 WO 20180222
- International Announcement: WO2019/043994 WO 20190307
- Main IPC: G05B23/02
- IPC: G05B23/02

Abstract:
A failure diagnosis system flexibly responds to a change in a diagnosis target by using a difference in measurement data before and after maintenance in predictive failure diagnosis. A pre-maintenance data DB stores measurement data before maintenance, and a post-maintenance data DB stores measurement data after maintenance. A feature detection algorithm group DB is provided where a plurality of feature detection algorithms are stored. A first feature is detected based on the measurement data by using each of the plurality of feature detection algorithms read from the feature detection algorithm group DB. An algorithm search unit selects one of the plurality of algorithms based on the feature thus detected. A second feature is detected from the measurement data by using the feature detection algorithm, and a sign predictive of failure of diagnosis of target equipment is diagnosed using the detected second feature.
Public/Granted literature
- US20200089207A1 FAILURE DIAGNOSIS SYSTEM Public/Granted day:2020-03-19
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