Invention Grant
- Patent Title: Method for manufacturing backside metalized compound semiconductor wafer
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Application No.: US16745705Application Date: 2020-01-17
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Publication No.: US11264231B2Publication Date: 2022-03-01
- Inventor: Tsung-Te Chiu , Bing-Han Chuang , Houng-Chi Wei
- Applicant: XIAMEN SANAN INTEGRATED CIRCUIT CO., LTD.
- Applicant Address: CN Fujian
- Assignee: XIAMEN SANAN INTEGRATED CIRCUIT CO., LTD.
- Current Assignee: XIAMEN SANAN INTEGRATED CIRCUIT CO., LTD.
- Current Assignee Address: CN Fujian
- Agency: Michael Best & Friedrich LLP
- Priority: CN201710624897.9 20170727
- Main IPC: H01L21/02
- IPC: H01L21/02 ; H01L21/768 ; H01L23/00

Abstract:
A method for manufacturing a backside metalized compound semiconductor wafer includes the steps of: providing a compound semiconductor wafer; attaching the compound semiconductor wafer to a supporting structure; forming an adhesion layer including nickel and vanadium on a back surface of the compound semiconductor wafer; forming an alloy layer including titanium and tungsten on the adhesion layer; forming a metallization layer including gold on the alloy layer; and removing the supporting structure from the compound semiconductor wafer to obtain the backside metalized compound semiconductor wafer.
Public/Granted literature
- US20200152445A1 METHOD FOR MANUFACTURING BACKSIDE METALIZED COMPOUND SEMICONDUCTOR WAFER Public/Granted day:2020-05-14
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