• Patent Title: Apparatus and method for beta-emission two-dimensional imaging
  • Application No.: US16490276
    Application Date: 2018-02-26
  • Publication No.: US11259768B2
    Publication Date: 2022-03-01
  • Inventor: Tomonori Fukuchi
  • Applicant: RIKEN
  • Applicant Address: JP Saitama
  • Assignee: RIKEN
  • Current Assignee: RIKEN
  • Current Assignee Address: JP Saitama
  • Agency: Osha Bergman Watanabe & Burton LLP
  • Priority: JPJP2017-038201 20170301
  • International Application: PCT/JP2018/007009 WO 20180226
  • International Announcement: WO2018/159548 WO 20180907
  • Main IPC: A61B6/00
  • IPC: A61B6/00 A61B5/06 G01T1/161 A61B6/03
Apparatus and method for beta-emission two-dimensional imaging
Abstract:
An apparatus for beta-emission two-dimensional imaging including: a beta ray detector configured to receive, from an imaging target containing a first nuclide and a second nuclide, a beta ray based on the first or second nuclide and thereby detect the beta ray, the beta ray detector outputting a beta ray detection signal including location information indicating a detection location of the beta ray on a two-dimensional basis; a gamma ray detector configured to detect a gamma ray, the gamma ray detector detecting the first and second peculiar gamma rays in a discriminable manner; and an imaging processor configured to be capable of generating a distribution image of the first nuclide and a distribution image of the second nuclide in a discriminable manner.
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