Invention Grant
- Patent Title: Appearance inspection system, setting device, image processing device, inspection method, and program
-
Application No.: US16251076Application Date: 2019-01-18
-
Publication No.: US11245842B2Publication Date: 2022-02-08
- Inventor: Yutaka Kato
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JPJP2018-044034 20180312
- Main IPC: H04N5/232
- IPC: H04N5/232 ; G05B19/05 ; G06T7/00 ; H04N5/225 ; B25J9/16

Abstract:
To provide an appearance inspection system capable of reduce labor for setting an imaging condition by a designer when a plurality of inspection target positions on a target is sequentially imaged. An appearance inspection system includes an imaging condition decision part and a route decision part. The imaging condition decision part decides a plurality of imaging condition candidates including a relative position between a workpiece and an imaging device for at least one inspection target position among a plurality of inspection target positions. The route decision part decides a change route of an imaging condition for sequentially imaging the plurality of inspection target positions by selecting one imaging condition among the plurality of imaging condition candidates so that a pre-decided requirement is satisfied.
Public/Granted literature
- US20190281213A1 APPEARANCE INSPECTION SYSTEM, SETTING DEVICE, IMAGE PROCESSING DEVICE, INSPECTION METHOD, AND PROGRAM Public/Granted day:2019-09-12
Information query