• Patent Title: Configuration tool and method for a quality control system
  • Application No.: US16650536
    Application Date: 2018-02-13
  • Publication No.: US11244507B2
    Publication Date: 2022-02-08
  • Inventor: Ives De Saeger
  • Applicant: ARKITE NV
  • Applicant Address: BE Genk
  • Assignee: ARKITE NV
  • Current Assignee: ARKITE NV
  • Current Assignee Address: BE Genk
  • Agency: Workman Nydegger
  • Priority: EP17193384 20170927
  • International Application: PCT/EP2018/053513 WO 20180213
  • International Announcement: WO2019/063133 WO 20190404
  • Main IPC: G06T19/00
  • IPC: G06T19/00 G01F15/075 G06F3/01 G06T15/08
Configuration tool and method for a quality control system
Abstract:
A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.
Public/Granted literature
Information query
Patent Agency Ranking
0/0