Invention Grant
- Patent Title: Configuration tool and method for a quality control system
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Application No.: US16650536Application Date: 2018-02-13
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Publication No.: US11244507B2Publication Date: 2022-02-08
- Inventor: Ives De Saeger
- Applicant: ARKITE NV
- Applicant Address: BE Genk
- Assignee: ARKITE NV
- Current Assignee: ARKITE NV
- Current Assignee Address: BE Genk
- Agency: Workman Nydegger
- Priority: EP17193384 20170927
- International Application: PCT/EP2018/053513 WO 20180213
- International Announcement: WO2019/063133 WO 20190404
- Main IPC: G06T19/00
- IPC: G06T19/00 ; G01F15/075 ; G06F3/01 ; G06T15/08

Abstract:
A configuration tool adapted to configure a quality control system to monitor and/or guide an operator in a working environment through recognition of objects, events or an operational process, comprises: a volumetric sensor adapted to capture volumetric image frames of the working environment while an object, event or operational process is demonstrated; a display, coupled to the volumetric sensor and configured to live display the volumetric image frames; and a processor configured to: generate a user interface in overlay of the volumetric image frames to enable a user to define a layout zone; and automatically generate a virtual box in the layout zone when an object, event or operational process is detected during demonstration of the object, event or operational process.
Public/Granted literature
- US20200312027A1 CONFIGURATION TOOL AND METHOD FOR A QUALITY CONTROL SYSTEM Public/Granted day:2020-10-01
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