- Patent Title: Examination apparatus, examination method, recording medium storing an examination program, learning apparatus, learning method, and recording medium storing a learning program
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Application No.: US16524162Application Date: 2019-07-28
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Publication No.: US11244443B2Publication Date: 2022-02-08
- Inventor: Kosuke Ikeda , Ira Leventhal , Keith Schaub
- Applicant: ADVANTEST CORPORATION
- Applicant Address: JP Tokyo
- Assignee: ADVANTEST CORPORATION
- Current Assignee: ADVANTEST CORPORATION
- Current Assignee Address: JP Tokyo
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06K9/62

Abstract:
Provided is an examination apparatus including a target image acquiring section that acquires a target image obtained by capturing an examination target; a target image masking section that masks a portion of the target image; a masked region predicting section that predicts an image of a masked region that is masked in the target image; a reproduced image generating section that generates a reproduced image using a plurality of predicted images predicted respectively for the plurality of masked regions; and a difference detecting section that detects a difference between the target image and the reproduced image.
Public/Granted literature
Information query