Invention Grant
- Patent Title: Method and system for correlating optical images with scanning electron microscopy images
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Application No.: US16508778Application Date: 2019-07-11
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Publication No.: US11244442B2Publication Date: 2022-02-08
- Inventor: Hucheng Lee , Lisheng Gao , Jan Lauber , Yong Zhang
- Applicant: KLA-Tencor Corporation
- Applicant Address: US CA Milpitas
- Assignee: KLA-Tencor Corporation
- Current Assignee: KLA-Tencor Corporation
- Current Assignee Address: US CA Milpitas
- Agency: Suiter Swantz pc llo
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T5/00 ; H01J37/22 ; H01J37/28

Abstract:
The correlation of optical images with SEM images includes acquiring a full optical image of a sample by scanning the sample with an optical inspection sub-system, storing the full optical image, identifying a location of a feature-of-interest present in the full optical image with an additional sources, acquiring an SEM image of a portion of the sample that includes the feature at the identified location with a SEM tool, acquiring an optical image portion at the location identified by the additional source, the image portions including a reference structure, correlating the image portion and the SEM image based on the presence of the feature-of-interest and the reference structure in both the image portions and the SEM image, and transferring a location of the feature-of-interest in the SEM image into the coordinate system of the image portion of the full optical image to form a corrected optical image.
Public/Granted literature
- US20190333206A1 Method and System for Correlating Optical Images with Scanning Electron Microscopy Images Public/Granted day:2019-10-31
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