Invention Grant
- Patent Title: Microscope apparatus, observation method, and microscope apparatus-control program
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Application No.: US16515555Application Date: 2019-07-18
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Publication No.: US11243386B2Publication Date: 2022-02-08
- Inventor: Kenta Matsubara
- Applicant: FUJIFILM Corporation
- Applicant Address: JP Tokyo
- Assignee: FUJIFILM Corporation
- Current Assignee: FUJIFILM Corporation
- Current Assignee Address: JP Tokyo
- Agency: Birch, Stewart, Kolasch & Birch, LLP
- Priority: JPJP2017-034680 20170227
- Main IPC: G02B21/00
- IPC: G02B21/00 ; G02B21/02 ; G02B21/24 ; G02B21/26

Abstract:
There are provided a microscope apparatus, an observation method, and a microscope apparatus-control program that can more efficiently perform auto-focus control and can shorten an imaging time in a case where a culture vessel is to be scanned by an image forming optical system and the auto-focus control is to be performed at each observation position. Focus information of a culture vessel is detected by a first displacement sensor and a second displacement sensor while a stage is moved to a scanning measurement position from an initial set position, and an auto-focus control unit performs auto-focus control at every observation position on the basis of the focus information in a case where the stage has been moved to the scanning measurement position.
Public/Granted literature
- US20190339498A1 MICROSCOPE APPARATUS, OBSERVATION METHOD, AND MICROSCOPE APPARATUS-CONTROL PROGRAM Public/Granted day:2019-11-07
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