Invention Grant
- Patent Title: Error correction circuit and operating method thereof
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Application No.: US17006525Application Date: 2020-08-28
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Publication No.: US11239865B2Publication Date: 2022-02-01
- Inventor: Jang Seob Kim
- Applicant: SK hynix Inc.
- Applicant Address: KR Icheon-si
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Icheon-si
- Agency: Perkins Coie LLP
- Priority: KR10-2018-0113292 20180920
- Main IPC: H03M13/37
- IPC: H03M13/37 ; H03M13/11 ; G06F11/10 ; H03M13/25

Abstract:
Disclosed are devices, systems and methods for error correction decoding using an iterative decoding scheme. An error correction circuit includes a node processor to perform a plurality of iterations for updating values of one or more variable nodes and one or more check nodes using initial values assigned to the one or more variable nodes, respectively, a trapping set detector to detect a trapping set in at least one of the plurality of iterations by applying a predetermined trapping set determination policy, and a post processor to reduce at least one of the initial values or invert at least one of values of the variable nodes corresponding to an iteration in which the trapping set is detected, upon detection of the trapping set.
Public/Granted literature
- US20210058099A1 ERROR CORRECTION CIRCUIT AND OPERATING METHOD THEREOF Public/Granted day:2021-02-25
Information query
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