An open-loop digital-to-analog converter (DAC) circuit may include a delta-sigma modulator, a decode block responsive to the delta-sigma modulator configured to perform a DAC decode operation, a plurality of DAC elements responsive to the DAC decode operation, an analog output driver responsive to the plurality of DAC elements, a test signal generator configured to generate a test signal that is responsive to inputs of the plurality of DAC elements, and a synchronizer configured to enable replication of the test signal at an external test system coupled to the open-loop DAC circuit in order to generate a matching test signal at the external test system that matches the test signal generated by the test signal generator.