Invention Grant
- Patent Title: Transmission electron microscope provided with at least one ballistic material jet source
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Application No.: US17049866Application Date: 2019-04-30
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Publication No.: US11239049B2Publication Date: 2022-02-01
- Inventor: Jean-Christophe Harmand , Laurent Travers , Yannick Ollivier
- Applicant: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Applicant Address: FR Paris
- Assignee: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Current Assignee: CENTRE NATIONAL DE LA RECHERCHE SCIENTIFIQUE
- Current Assignee Address: FR Paris
- Agency: Greer, Burns & Crain Ltd.
- Priority: FR1853774 20180502
- International Application: PCT/EP2019/061115 WO 20190430
- International Announcement: WO2019/211305 WO 20191107
- Main IPC: H01J37/26
- IPC: H01J37/26

Abstract:
A transmission electron microscope is provided, including a column defining an object chamber, at least one ballistic material jet source outside the object chamber, and tightly attached to the column, facing an opening, referred to as a port, provided on the column; having at least one jet source arranged outside the column and including a collimator of the material jet towards a predetermined direction, passing through the port and leading into the object chamber so that a portion of the material jet exits the source in the object chamber.
Public/Granted literature
- US20210241994A1 TRANSMISSION ELECTRON MICROSCOPE PROVIDED WITH AT LEAST ONE BALLISTIC MATERIAL JET SOURCE Public/Granted day:2021-08-05
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