In one embodiment, there is provided detector for an inspection system, including at least one first scintillator configured to, in response to interaction with a pulse of inspection radiation, re-emit first light in a first wavelength domain, at least one second scintillator configured to, in response to interaction with the pulse of inspection radiation, re-emit second light in a second wavelength domain different from the first wavelength domain, and at least one first sensor configured to measure the first light and the second light.