Invention Grant
- Patent Title: Lidar scanning with expanded scan angle
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Application No.: US15591974Application Date: 2017-05-10
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Publication No.: US11237251B2Publication Date: 2022-02-01
- Inventor: Terry A. Bartlett
- Applicant: Texas Instruments Incorporated
- Applicant Address: US TX Dallas
- Assignee: Texas Instruments Incorporated
- Current Assignee: Texas Instruments Incorporated
- Current Assignee Address: US TX Dallas
- Agent Michelle F. Murray; Charles A. Brill; Frank D. Cimino
- Main IPC: G01S7/481
- IPC: G01S7/481 ; G01S17/42 ; G01S17/931

Abstract:
In described examples of a system for outputting a patterned light beam, the system includes: an illumination source; a positive optical element positioned to receive light from the illumination source and to output converging light; a reflective element positioned to receive the converging light from the positive optical element, the reflective element configured to reflect the converging light to form a scan beam; and a negative optical element to receive the scan beam from the reflective element, the negative optical element configured to output the scan beam to a field of view.
Public/Granted literature
- US20170328989A1 LIDAR SCANNING WITH EXPANDED SCAN ANGLE Public/Granted day:2017-11-16
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