Invention Grant
- Patent Title: Magnetic sensor and inspection device
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Application No.: US17169388Application Date: 2021-02-05
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Publication No.: US11237230B1Publication Date: 2022-02-01
- Inventor: Hitoshi Iwasaki , Satoshi Shirotori , Akira Kikitsu , Yoshihiro Higashi
- Applicant: KABUSHIKI KAISHA TOSHIBA
- Applicant Address: JP Tokyo
- Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee: KABUSHIKI KAISHA TOSHIBA
- Current Assignee Address: JP Tokyo
- Agency: Finnegan, Henderson, Farabow, Garrett & Dunner L.L.P.
- Priority: JPJP2020-153915 20200914
- Main IPC: G01R33/09
- IPC: G01R33/09 ; G01R15/20 ; G01N27/90 ; G01R19/00 ; G01R31/382 ; A61B5/243 ; A61B5/245

Abstract:
According to one embodiment, a magnetic sensor includes a sensor part, a first circuit, and a second circuit. The sensor part includes a magnetic element part, first and second conductive members. The magnetic element part includes first to fourth magnetic elements. The first conductive member includes first to third conductive portions, and first and second middle portions. The second conductive member includes fourth to sixth conductive portions, and third and fourth middle portions. The first circuit is electrically connected to the third and sixth conductive portions. The first circuit is configured to supply a first current between the third and sixth conductive portions. The second circuit is electrically connected to a first connection point and a second connection point. The second circuit is electrically connected to first and second connection points. The second circuit is configured to supply a second current between the first and second connection points.
Information query