Device for analyzing sensitivity of object using frequency response and analyzing method using the same
Abstract:
A sensitivity analyzing device and method are disclosed. The device includes a vibration exciter to configure a vibration exciting pattern and apply a physical force to one face of a test object based on the pattern; a first sensor in contact with the one face of the test object to measure a physical force applied to the test object; a second sensor in contact with an opposite face of the test object to collect a vibration of the test object caused by the physical force; and a sensitivity analyzer configured to: control the vibration exciter to configure the vibration exciting pattern; convert the physical force signal measured by the first sensor and the vibration signal collected by the second sensor in responses to the vibration exciting pattern into frequency domain signals to calculate a frequency response function of the test object; and calculate a sensitivity index of the test object.
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