Invention Grant
- Patent Title: Device for analyzing sensitivity of object using frequency response and analyzing method using the same
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Application No.: US16778829Application Date: 2020-01-31
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Publication No.: US11237079B2Publication Date: 2022-02-01
- Inventor: Chan Jung Kim
- Applicant: PUKYONG NATIONAL UNIVERSITY INDUSTRY-UNIVERSITY COOPERATION FOUNDATION
- Applicant Address: KR Busan
- Assignee: PUKYONG NATIONAL UNIVERSITY INDUSTRY-UNIVERSITY COOPERATION FOUNDATION
- Current Assignee: PUKYONG NATIONAL UNIVERSITY INDUSTRY-UNIVERSITY COOPERATION FOUNDATION
- Current Assignee Address: KR Busan
- Agency: Norton Rose Fulbright US LLP
- Priority: KR10-2019-0159479 20191204
- Main IPC: G01M7/02
- IPC: G01M7/02 ; G01R23/16

Abstract:
A sensitivity analyzing device and method are disclosed. The device includes a vibration exciter to configure a vibration exciting pattern and apply a physical force to one face of a test object based on the pattern; a first sensor in contact with the one face of the test object to measure a physical force applied to the test object; a second sensor in contact with an opposite face of the test object to collect a vibration of the test object caused by the physical force; and a sensitivity analyzer configured to: control the vibration exciter to configure the vibration exciting pattern; convert the physical force signal measured by the first sensor and the vibration signal collected by the second sensor in responses to the vibration exciting pattern into frequency domain signals to calculate a frequency response function of the test object; and calculate a sensitivity index of the test object.
Public/Granted literature
- US20210172829A1 DEVICE FOR ANALYZING SENSITIVITY OF OBJECT USING FREQUENCY RESPONSE AND ANALYZING METHOD USING THE SAME Public/Granted day:2021-06-10
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