Memory device capable of improving a threshold voltage distribution of memory cells and method of operating the memory device
Abstract:
A memory device according to an embodiment includes a memory cell block including a plurality of pages with each page corresponding to a word line of a plurality of word lines, a peripheral circuit configured to perform a program operation on the plurality of pages, and control logic configured to control the peripheral circuit to perform the program operation. The control logic changes and sets a bit line voltage applied to bit lines of the memory cell block during a program verify operation of the program operation according to a program order of each of the plurality of pages.
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