Data is received that characterizes an integrated circuit and which includes a plurality of Standard Test Interface Language (STIL) codes and at least one file defining physical and/or logical parameters of the integrated circuit. Thereafter, using the received data, a power integrity analysis of the integrated circuit is performed to estimate power induced noise in a double glitch capture mode. Data is then provided that characterizes the performed double glitch capture mode power integrity analysis of the integrated circuit. Related apparatus, systems, techniques and articles are also described.