Invention Grant
- Patent Title: Microscope and method for imaging a sample
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Application No.: US16091524Application Date: 2017-04-07
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Publication No.: US11215804B2Publication Date: 2022-01-04
- Inventor: Werner Knebel , Florian Fahrbach
- Applicant: Leica Microsystems CMS GmbH
- Applicant Address: DE Wetzlar
- Assignee: Leica Microsystems CMS GmbH
- Current Assignee: Leica Microsystems CMS GmbH
- Current Assignee Address: DE Wetzlar
- Agency: Leydig, Voit & Mayer, Ltd.
- Priority: LU93021 20160408
- International Application: PCT/EP2017/058427 WO 20170407
- International Announcement: WO2017/174795 WO 20171012
- Main IPC: G02B21/32
- IPC: G02B21/32 ; G02B21/00 ; G02B21/36 ; G02B21/06

Abstract:
A microscope for imaging a sample includes an illumination unit for emitting illumination light to the sample; a detector for capturing a detection light originating from the sample; an optical system for focusing the illumination light onto the sample and focusing the detection light onto the detector; and a scanning unit for scanning the sample using the illumination light. The illumination unit emits the illumination light as separate illumination light beams which can be focused on spatially mutually separated, strip-like sample regions simultaneously. The detector captures the detection light in the form of separate detection light beams originating from the sample regions simultaneously and in a spatially mutually separated manner. The sample regions are in sample planes, and the detector having sub-detectors, which are each assigned to a sample plane and capture a detection light beam that originates from a respective sample plane.
Public/Granted literature
- US20190129153A1 MICROSCOPE AND METHOD FOR IMAGING A SAMPLE Public/Granted day:2019-05-02
Information query
IPC分类:
G | 物理 |
G02 | 光学 |
G02B | 光学元件、系统或仪器 |
G02B21/00 | 显微镜 |
G02B21/32 | .结构上与显微镜组合的微型控制器 |