Invention Grant
- Patent Title: Visual inspections device, method of manufacturing and program the same
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Application No.: US16863508Application Date: 2020-04-30
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Publication No.: US11215564B2Publication Date: 2022-01-04
- Inventor: Hideki Wada
- Applicant: RENESAS ELECTRONICS CORPORATION
- Applicant Address: JP Tokyo
- Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee: RENESAS ELECTRONICS CORPORATION
- Current Assignee Address: JP Tokyo
- Agency: McDermott Will & Emery LLP
- Main IPC: G01N21/88
- IPC: G01N21/88

Abstract:
The visual inspection device comprises a first illumination device capable of illuminating an top surface of an inspection object, a second illumination device capable of illuminating a bottom surface opposite to the top surface of the inspection object and a first imaging device capable of capturing the top surface of the inspection object. A relative position of each of the first illumination device and the second illumination device and the inspection object are adjusted such that a part of the captured image captured by the first imaging device is disappeared.
Public/Granted literature
- US20210341394A1 VISUAL INSPECTIONS DEVICE, METHOD OF MANUFACTURING AND PROGRAM THE SAME Public/Granted day:2021-11-04
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