Invention Grant
- Patent Title: Method for reducing metal contamination and film deposition apparatus
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Application No.: US15935580Application Date: 2018-03-26
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Publication No.: US11214864B2Publication Date: 2022-01-04
- Inventor: Takahito Umehara
- Applicant: Tokyo Electron Limited
- Applicant Address: JP Tokyo
- Assignee: Tokyo Electron Limited
- Current Assignee: Tokyo Electron Limited
- Current Assignee Address: JP Tokyo
- Agency: IPUSA, PLLC
- Priority: JPJP2017-064368 20170329
- Main IPC: C23C16/02
- IPC: C23C16/02 ; C23C16/44 ; C23C16/40 ; C23C16/455 ; H01L21/67 ; H01L21/687

Abstract:
A method for reducing metal contamination performed after dry cleaning of a process chamber used for a film deposition process and before starting the film deposition process is provided. In the method, a temperature in the process chamber is changed from a first temperature during the dry cleaning to a film deposition temperature. Hydrogen and oxygen are activated in the vacuum chamber while supplying hydrogen and oxygen into the process chamber. An inside of the process chamber is coated by performing the film deposition process without a substrate in the process chamber after the step of activating hydrogen and oxygen.
Public/Granted literature
- US20180282862A1 METHOD FOR REDUCING METAL CONTAMINATION AND FILM DEPOSITION APPARATUS Public/Granted day:2018-10-04
Information query
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