- Patent Title: In-situ fiber characterization using nonlinear skirt measurement
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Application No.: US16365890Application Date: 2019-03-27
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Publication No.: US11139633B2Publication Date: 2021-10-05
- Inventor: Yinqing Pei , David W. Boertjes
- Applicant: Ciena Corporation
- Applicant Address: US MD Hanover
- Assignee: Ciena Corporation
- Current Assignee: Ciena Corporation
- Current Assignee Address: US MD Hanover
- Agency: Clements Bernard Baratta
- Agent Lawrence A. Baratta, Jr.; Christopher L. Bernard
- Main IPC: H01S3/00
- IPC: H01S3/00 ; H01S3/067

Abstract:
A system includes a processor communicatively coupled to an Amplifier Stimulated Emission (ASE) source and an optical receiver, wherein the processor is configured to cause transmission of one or more shaped ASE signals, from the ASE source, on an optical fiber, obtain received spectrum of the one or more shaped ASE signals from the optical receiver connected to the optical fiber, and characterize the optical fiber based in part on a nonlinear skirt and/or center dip depth in the received spectrum of the one or more shaped ASE signals. The one or more shaped ASE signals can be formed by the ASE source communicatively coupled to a Wavelength Selective Switch (WSS) that is configured to shape ASE from the ASE source to form the one or more shaped ASE signals with one or two or multiple peaks and with associated frequency.
Public/Granted literature
- US20200313380A1 In-situ fiber characterization using nonlinear skirt measurement Public/Granted day:2020-10-01
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