Invention Grant
- Patent Title: Visible cephalometric measurement method, system and computer processing device
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Application No.: US16108011Application Date: 2018-08-21
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Publication No.: US11138730B2Publication Date: 2021-10-05
- Inventor: Minfeng Chen , Jing Lei
- Applicant: Fussen Technology Co., Ltd.
- Applicant Address: CN Shenzhen
- Assignee: Fussen Technology Co., Ltd.
- Current Assignee: Fussen Technology Co., Ltd.
- Current Assignee Address: CN Shenzhen
- Agency: Hemisphere Law, PLLC
- Agent Zhigang Ma
- Priority: CN201710780875.1 20170901,CN201711062524.3 20171102
- Main IPC: A61B6/00
- IPC: A61B6/00 ; G06T7/00 ; G06T7/60 ; G06T7/70 ; G16H50/20

Abstract:
A method for visible cephalometric measurement is provided. The method comprises: acquiring a data item to be measured according to a preset analysis method, and acquiring preset reference information; determining a measurement reference point according to the acquired preset reference information; and generating a measurement result based on the measurement reference point and the data item to be measured, and displaying it. A computer processing device and a visible cephalometric system are also provided. The computer may automatically generate measurement results according to user's selection and perform cephalometric measurement more easily, accurately, and more efficiently.
Public/Granted literature
- US20190073771A1 VISIBLE CEPHALOMETRIC MEASUREMENT METHOD, SYSTEM AND COMPUTER PROCESSING DEVICE Public/Granted day:2019-03-07
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