Invention Grant
- Patent Title: Statistical facility event monitor
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Application No.: US16455808Application Date: 2019-06-28
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Publication No.: US11138532B1Publication Date: 2021-10-05
- Inventor: Justin N. Smith , Christine Cai , Mark S. Nowotarski
- Applicant: Applied Underwriters, Inc.
- Applicant Address: US NE Omaha
- Assignee: Applied Underwriters, Inc.
- Current Assignee: Applied Underwriters, Inc.
- Current Assignee Address: US NE Omaha
- Agent Mark Nowotarski
- Main IPC: G06Q10/06
- IPC: G06Q10/06 ; G06F17/18 ; G05B23/02 ; G01D4/14
Abstract:
A statistical facility event monitor has a computer implemented event percentile meter. The event percentile meter counts the number of randomly initiated events that cause a monitored facility to consume a monitored utility over a monitored time period. The event percentile meter then calculates a cumulative distribution function for the randomly initiated events. The event percentile meter uses the cumulative distribution to determine the event percentile for the monitored facility. The event percentile meter then outputs the event percentile.
Information query
