Invention Grant
- Patent Title: Scanned antenna and method of inspecting scanned antenna
-
Application No.: US16083991Application Date: 2017-03-10
-
Publication No.: US11081790B2Publication Date: 2021-08-03
- Inventor: Fumitoshi Yasuo , Takeshi Hara , Shinya Kadono , Junichi Inukai , Tomohiro Kosaka
- Applicant: SHARP KABUSHIKI KAISHA
- Applicant Address: JP Sakai
- Assignee: SHARP KABUSHIKI KAISHA
- Current Assignee: SHARP KABUSHIKI KAISHA
- Current Assignee Address: JP Sakai
- Agency: ScienBizip, P.C.
- Priority: JPJP2016-048279 20160311
- International Application: PCT/JP2017/009701 WO 20170310
- International Announcement: WO2017/155084 WO 20170914
- Main IPC: H01Q3/34
- IPC: H01Q3/34 ; H01Q15/14 ; H01Q21/06 ; H01P11/00 ; H01Q3/44 ; H01Q13/22 ; H01Q21/00

Abstract:
A scanning antenna includes a TFT substrate including a plurality of patch electrodes, a slot substrate including a slot electrode, and a liquid crystal layer provided between the TFT substrate and the slot substrate. The slot electrode includes a plurality of slots disposed corresponding to the plurality of patch electrodes and a solid portion not including the plurality of slot. When viewed from a normal direction of the substrate, the patch electrode is disposed across the slot in a first direction and overlaps the solid portion at both ends of the slot in each of a plurality of antenna units, and when viewed from the normal direction of the substrate, at least one of a periphery of the solid portion and a periphery of the patch electrode includes a recessed portion or a protruding portion in at least one antenna unit of the plurality of antenna units.
Public/Granted literature
- US20200295457A1 SCANNED ANTENNA AND METHOD OF INSPECTING SCANNED ANTENNA Public/Granted day:2020-09-17
Information query