Invention Grant
- Patent Title: Semiconductor device and method for fabricating the same including re-growth process to form non-uniform gate dielectric layer
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Application No.: US16533370Application Date: 2019-08-06
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Publication No.: US11081357B2Publication Date: 2021-08-03
- Inventor: Seon-Haeng Lee
- Applicant: SK hynix Inc.
- Applicant Address: KR Gyeonggi-do
- Assignee: SK hynix Inc.
- Current Assignee: SK hynix Inc.
- Current Assignee Address: KR Gyeonggi-do
- Agency: IP & T Group LLP
- Priority: KR10-2018-0162195 20181214
- Main IPC: H01L21/28
- IPC: H01L21/28 ; H01L29/40 ; H01L29/66 ; H01L21/8238 ; H01L29/78 ; H01L29/49 ; H01L29/423

Abstract:
A method for fabricating a semiconductor device includes: forming a gate structure including a source side and a drain side over a substrate, wherein a dielectric material and a columnar crystal grain material are stacked over the substrate; doping a chemical species on the drain side of the gate structure; and exposing the gate structure doped with the chemical species to a re-growth process in order to thicken the dielectric material on the drain side of the gate structure.
Information query
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