Invention Grant
- Patent Title: Image inspecting apparatus, image inspecting method and image inspecting program
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Application No.: US16219958Application Date: 2018-12-14
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Publication No.: US11080843B2Publication Date: 2021-08-03
- Inventor: Shingo Inazumi , Yutaka Kato
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JPJP2018-038540 20180305
- Main IPC: G06T7/00
- IPC: G06T7/00 ; H04N5/232 ; H04N5/247 ; G01N21/95 ; B25J9/16 ; G01N21/88 ; G01N21/956

Abstract:
An image inspecting apparatus includes at least one image capturing part, a lighting part, a control part including a moving part, a searching part analyzing an image captured by the image capturing part under a first image capturing condition and searching for a defect candidate from an object under inspection, and a determining part. When the searching part finds the defect candidate from the object under inspection, the control part controls an image capturing condition such that a part where the defect candidate is found by the searching part is photographed under a second image capturing condition that is clearer than the first image capturing condition. The determining part analyzes an image captured by the image capturing part under the second image capturing condition and determines whether the defect of the object under inspection is present or absent.
Public/Granted literature
- US20190272630A1 IMAGE INSPECTING APPARATUS, IMAGE INSPECTING METHOD AND IMAGE INSPECTING PROGRAM Public/Granted day:2019-09-05
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