Invention Grant
- Patent Title: Appearance inspection system, image processing device, imaging device, and inspection method
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Application No.: US16251093Application Date: 2019-01-18
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Publication No.: US11080836B2Publication Date: 2021-08-03
- Inventor: Yutaka Kato , Yasuhito Uetsuji
- Applicant: OMRON Corporation
- Applicant Address: JP Kyoto
- Assignee: OMRON Corporation
- Current Assignee: OMRON Corporation
- Current Assignee Address: JP Kyoto
- Agency: JCIPRNET
- Priority: JPJP2018-044035 20180312
- Main IPC: G06T7/00
- IPC: G06T7/00 ; B25J9/16 ; H04N5/232

Abstract:
An appearance inspection system includes a setting part, a movement mechanism, and a control part. The setting part sets a route passing through a plurality of imaging positions in order. The setting part sets the route so that a first time necessary for the movement mechanism to move an imaging device from a first imaging position to a second imaging position among the plurality of imaging positions is longer than a second time necessary for a process of changing a first imaging condition corresponding to the first imaging position to a second imaging condition corresponding to the second imaging position by the control part. The control part starts the process of changing the first imaging condition to the second imaging condition earlier by the second time or more than a scheduled time at which the imaging device arrives at the second imaging position.
Public/Granted literature
- US20190279351A1 APPEARANCE INSPECTION SYSTEM, IMAGE PROCESSING DEVICE, IMAGING DEVICE, AND INSPECTION METHOD Public/Granted day:2019-09-12
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