Invention Grant
- Patent Title: Apparatus and methods for automatic time measurements
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Application No.: US15889737Application Date: 2018-02-06
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Publication No.: US11079723B2Publication Date: 2021-08-03
- Inventor: Min Chu , Jagdeep Singh Bal
- Applicant: Integrated Device Technology, Inc.
- Applicant Address: US CA San Jose
- Assignee: Integrated Device Technology, Inc.
- Current Assignee: Integrated Device Technology, Inc.
- Current Assignee Address: US CA San Jose
- Agency: Haynes and Boone, LLP
- Main IPC: G04F10/00
- IPC: G04F10/00 ; H03K3/03 ; H03K5/159 ; H03K5/135 ; G04F10/02 ; H03K21/38 ; H03K5/00

Abstract:
A time-to-digital converter obtains a Start signal to indicate the start of an event, and a Stop signal whose assertion indicates the stop of the event. The Stop signal can be asserted multiple times due to false indications of the event stop. The TDC continuously monitors the Stop signal to generate a separate digital value for the duration from the event's starting time to each assertion of the Stop signal. The digital values can be analyzed to select the true duration of the event. Other features and embodiments are also provided.
Public/Granted literature
- US20190243312A1 APPARATUS AND METHODS FOR AUTOMATIC TIME MEASUREMENTS Public/Granted day:2019-08-08
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