Invention Grant
- Patent Title: Marker and posture estimating method using marker
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Application No.: US16332733Application Date: 2017-09-05
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Publication No.: US11030770B2Publication Date: 2021-06-08
- Inventor: Hideyuki Tanaka
- Applicant: National Institute of Advanced Industrial Science and Technology
- Applicant Address: JP Tokyo
- Assignee: National Institute of Advanced Industrial Science and Technology
- Current Assignee: National Institute of Advanced Industrial Science and Technology
- Current Assignee Address: JP Tokyo
- Agency: Workman Nydegger
- Priority: JPJP2016-178590 20160913
- International Application: PCT/JP2017/031925 WO 20170905
- International Announcement: WO2018/051843 WO 20180322
- Main IPC: G06T7/73
- IPC: G06T7/73 ; G01B11/26 ; G06T1/00 ; G01B11/00 ; G06T7/90

Abstract:
The present invention provides a marker that can uniquely estimate the posture within wide-angle range while maintaining the flatness, and a posture estimating method. The marker includes a two-dimensional pattern code and a posture detection pattern emitting different light depending on an observation direction of the pattern code at around the first axis on a two-dimensional plane formed by the pattern code. The method using the marker has a Step-1 of using a captured image of the marker to identify a color of the light or a pattern drawn by the light, Step-2 of determining, depending on the color or the pattern identified in Step-1, a posture of the marker at around the first axis, and a Step-3 of determining a posture of the marker depending on a positional relation between the posture at around the first axis determined in Step-2 and the elements constituting the captured image.
Public/Granted literature
- US20190228541A1 Marker and Posture Estimating Method Using Marker Public/Granted day:2019-07-25
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