Invention Grant
- Patent Title: Memory storage device having automatic error repair mechanism and method thereof
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Application No.: US16790750Application Date: 2020-02-14
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Publication No.: US10998081B1Publication Date: 2021-05-04
- Inventor: San-Ha Park
- Applicant: Winbond Electronics Corp.
- Applicant Address: TW Taichung
- Assignee: Winbond Electronics Corp.
- Current Assignee: Winbond Electronics Corp.
- Current Assignee Address: TW Taichung
- Agency: JCIPRNET
- Main IPC: G11C16/06
- IPC: G11C16/06 ; G11C29/00 ; G11C29/42 ; G11C29/44 ; G11C29/02 ; G11C11/406 ; G11C29/24 ; G11C29/12

Abstract:
The disclosure is directed to a memory storage device and an automatic error repair method thereof. In an aspect, the memory storage device includes a connection interface configured to receive a write command and a word line address associated with the write command, a memory array including a memory bank which contains an error correction code (ECC) detector, a plurality of memory cells controlled by a word line address, and a plurality of redundant memory cells controlled by a redundant word line address, a fuse blowing controller configured to receive the word line address to blow an electrical fuse of the word line address to enable the plurality of redundant memory cells, and a memory control circuit configured to transfer data from the plurality of memory cells through a bit line into the plurality of redundant memory cells in response to the electrical fuse having been blown.
Information query