Invention Grant
- Patent Title: Inspection apparatus, inspection method, and computer readable recording medium storing inspection program
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Application No.: US16294031Application Date: 2019-03-06
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Publication No.: US10997702B2Publication Date: 2021-05-04
- Inventor: Atsunori Moteki , Toshiyuki Yoshitake , Ayu Karasudani , Mitsuhiro Makita
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JPJP2018-046251 20180314
- Main IPC: G06T7/00
- IPC: G06T7/00 ; G06T7/543 ; G06K9/62 ; G06K9/46

Abstract:
An inspection apparatus includes a memory for storing shape information including a plurality of line segments representing a shape of an object; and a processor coupled to the memory and the processor that detects a plurality of feature lines from an image of the object, generates a plurality of combinations obtained by correlating each of the plurality of line segments and each of the plurality of feature lines with each other, generates a plurality of projection lines by projecting each of the plurality of line segments onto the image, sets a threshold value with respect to an error between a position of the projection lines and a position of the feature lines of the line segments included in each of the plurality of combinations based on a statistical value of the error, and classifies the plurality of combinations using the threshold value.
Public/Granted literature
Information query