A system and method are provided for testing features of an embedded system. The system includes a low-powered computing device communicatively coupled to a control application interface, a sensor interface, and a robotic interface. The low-powered computing device may receive sensor signals generated during a test, provide sensor data corresponding to the sensor signals, receive commands for the test, and provide instructions for movement of a robotic handler corresponding to at least one of the commands for the test. The system also includes a computing device communicatively coupled to the control application interface, an image processing interface, and a database interface. The computing device may receive sensor data, receive image data corresponding to images of the embedded system captured during the test, receive tests capable of being performed, and provide commands for the test.