Invention Grant
- Patent Title: Parameter analysis method and apparatus
-
Application No.: US16291086Application Date: 2019-03-04
-
Publication No.: US10972178B2Publication Date: 2021-04-06
- Inventor: Takahito Tanimura
- Applicant: FUJITSU LIMITED
- Applicant Address: JP Kawasaki
- Assignee: FUJITSU LIMITED
- Current Assignee: FUJITSU LIMITED
- Current Assignee Address: JP Kawasaki
- Agency: Fujitsu Patent Center
- Priority: JPJP2018-041439 20180308
- Main IPC: H04B10/08
- IPC: H04B10/08 ; H04B10/07 ; G06N20/00 ; G06N3/08

Abstract:
A parameter analysis method executable by a computer, the method includes training a model configured to output an index value relating to a characteristic of an optical signal, and changing the characteristic of the optical signal usable for training the model.
Public/Granted literature
- US20190280766A1 PARAMETER ANALYSIS METHOD AND APPARATUS Public/Granted day:2019-09-12
Information query