Invention Grant
- Patent Title: Mass spectrometer and mass spectrometry method
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Application No.: US16647306Application Date: 2018-07-31
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Publication No.: US10971345B2Publication Date: 2021-04-06
- Inventor: Masahiro Kotani , Takayuki Ohmura
- Applicant: HAMAMATSU PHOTONICS K.K.
- Applicant Address: JP Hamamatsu
- Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee: HAMAMATSU PHOTONICS K.K.
- Current Assignee Address: JP Hamamatsu
- Agency: Faegre Drinker Biddle & Reath LLP
- Priority: JPJP2017-181611 20170921,JPJP2017-237846 20171212
- International Application: PCT/JP2018/028670 WO 20180731
- International Announcement: WO2019/058767 WO 20190328
- Main IPC: H01J49/04
- IPC: H01J49/04 ; H01J49/00

Abstract:
A mass spectrometer includes: a chamber; a support that, in a state in which, in a sample support body that includes a substrate in which a plurality of through-holes open in first and second surfaces are formed and a conductive layer that is at least provided on the first surface, the second surface thereof is in contact with a sample, supports the sample and the sample support body; a laser beam irradiation part that irradiates the first surface with a laser beam; a voltage application part that applies a voltage to the conductive layer; an ion detection part that, detects the ionized components of the sample in a space inside the chamber; a first light irradiation part that irradiates the sample with a first light from a side of the substrate; and an imaging part that obtains a reflected light image of the sample by the first light.
Public/Granted literature
- US20200219710A1 MASS SPECTROMETER AND MASS SPECTROMETRY METHOD Public/Granted day:2020-07-09
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