Invention Grant
- Patent Title: Ion source and cleaning method thereof
-
Application No.: US16787748Application Date: 2020-02-11
-
Publication No.: US10971339B2Publication Date: 2021-04-06
- Inventor: Masakazu Adachi , Yuya Hirai , Tomoya Taniguchi
- Applicant: NISSIN ION EQUIPMENT CO., LTD.
- Applicant Address: JP Koka
- Assignee: NISSIN ION EQUIPMENT CO., LTD.
- Current Assignee: NISSIN ION EQUIPMENT CO., LTD.
- Current Assignee Address: JP Koka
- Agency: Sughrue Mion, PLLC
- Priority: JPJP2019-037302 20190301
- Main IPC: H01J37/08
- IPC: H01J37/08 ; H01J37/30 ; H01J37/32

Abstract:
An ion source includes a plasma chamber, and a suppression electrode disposed downstream of the plasma chamber, and is operable to irradiate the suppression electrode with an ion beam produced from a cleaning gas to clean the suppression electrode. Prior to cleaning, the ion source moves the suppression electrode or the plasma chamber in a first direction to increase a distance between the plasma chamber and the suppression electrode.
Public/Granted literature
- US20200279720A1 ION SOURCE AND CLEANING METHOD THEREOF Public/Granted day:2020-09-03
Information query