Invention Grant
- Patent Title: Automatic test system and method thereof
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Application No.: US16541333Application Date: 2019-08-15
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Publication No.: US10970198B2Publication Date: 2021-04-06
- Inventor: Qun Wu , Xuefeng Chen , Dong-Rui Xue
- Applicant: Inventec (Pudong) Technology Corporation , INVENTEC CORPORATION
- Applicant Address: CN Shanghai; TW Taipei
- Assignee: Inventec (Pudong) Technology Corporation,INVENTEC CORPORATION
- Current Assignee: Inventec (Pudong) Technology Corporation,INVENTEC CORPORATION
- Current Assignee Address: CN Shanghai; TW Taipei
- Agency: Locke Lord LLP
- Agent Tim Tingkang Xia, Esq.
- Priority: CN201910562301.6 20190626
- Main IPC: G06F11/36
- IPC: G06F11/36 ; G06F11/30 ; G06F11/34

Abstract:
An automatic test system suitable for testing a server comprises a storage device, a computing device, and a sensing device. The storage device stores an automatic test script. The sensing device collects a plurality of test results of the server. The automatic test script comprises a parameter configuration module, a data processing module, and a core logic module. The parameter configuration module provides a plurality of configuration parameters associated with a server test procedure. The data processing module comprises a data recording sub-module and a data sorting sub-module, while the former receives an output data set from the server test procedure, and the latter generates a test report according to the output data set and the configuration parameters. The core logic module comprises a plurality of instruction sets for controlling the server test procedure through a data exchange interface.
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